Metal work-function-dependent barrier height of Ni contacts with metal-embedded nanoparticles to 4H-SiC

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Metal work-function-dependent barrier height of Ni contacts with metal-embedded nanoparticles to 4H-SiC

Metal, typically gold [Au], nanoparticles [NPs] embedded in a capping metal contact layer onto silicon carbide [SiC] are considered to have practical applications in changing the barrier height of the original contacts. Here, we demonstrate the use of silver [Ag] NPs to effectively lower the barrier height of the electrical contacts to 4H-SiC. It has been shown that the barrier height of the fa...

متن کامل

Demonstration of the First 4H-SiC Metal-Semiconductor-Metal Ultraviolet Photodetector

Abstract. This paper demonstrates the first 4H-SiC metal-semiconductor-metal (MSM) UV photodetector. Two types of MSM photodetectors are fabricated for comparison: one in p-type 4HSiC and the other in n-type 4H-SiC. The n-type SiC photodetectors show a low dark current less than 10nA at -15V bias while the p-type ones show a lower dark current of 0.3nA at -25V. Photoresponsivity is measured fro...

متن کامل

X-ray photoemission determination of the Schottky barrier height of metal contacts to n–GaN and p–GaN

Synchrotron radiation-based x-ray photoemission spectroscopy was used to study the surface Fermi level position within the band gap for thin metal overlayers of Au, Al, Ni, Ti, Pt, and Pd on n–GaN and p–GaN. Nonequilibrium effects were taken into account by measuring the Fermi edge of the metal overlayer. There are two different behaviors observed for the six metals studied. For Au, Ti, and Pt,...

متن کامل

Metal contacts to n-GaN

Al, Au, Ti/Al and Ti/Au contacts were prepared on n-GaN and annealed up to 900 8C. The structure, phase and morphology were studied by cross-sectional transmission and scanning electron microscopy as well as by X-ray diffraction (XRD), the electrical behaviour by current–voltage measurements. It was obtained that annealing resulted in interdiffusion, lateral diffusion along the surface, alloyin...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Nanoscale Research Letters

سال: 2012

ISSN: 1556-276X

DOI: 10.1186/1556-276x-7-75